Single Reflection Zone Plate Combines Soft X-Ray Imaging and RIXS Mapping

An international collaboration of researchers from Germany, Switzerland, and Japan has shown that a single reflection zone plate (RZP) can simultaneously perform soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. This breakthrough, reported in a recent study, could lead to simpler and more efficient instruments for probing both the spatial structure and electronic properties of materials. Traditionally, combining imaging and spectroscopy in the soft X-ray regime required separate optical elements or complex setups. The new approach uses one RZP to focus the beam for imaging while also dispersing the scattered X-rays for RIXS, enabling correlated measurements in a single shot. This reduces alignment challenges and increases throughput. The demonstration involved a test sample and achieved spatial and spectral resolutions suitable for studying heterogeneous systems like catalysts, battery materials, and quantum devices. The ability to map chemical states and electronic excitations with nanoscale precision is crucial for understanding structure-function relationships. With this proof of concept, the team anticipates that future beamlines and laboratory instruments can adopt the design to streamline multi-modal X-ray analysis, accelerating discoveries in materials science and condensed matter physics.